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Photo of Jun  Yan, Ph.D.

Jun Yan, Ph.D.

Associate Professor, Statitics
Academic Office Location:
Department of Statistics
University of Connecticut
215 Glenbrook Rd. U-4120
Storrs, CT 06269
Phone: 860-486-3416
Fax: 860-486-4113
Email: jun.yan@uconn.edu
Website(s):

Department of Statistics

Personal Website

Education
DegreeInstitutionMajor
OtherRenmin University of ChinaStatistics
M.A.University of MiamiEconomics
Ph.D.University of Wisconsin Statistics

Awards
Name of Award/HonorAwarding Organization
Innovations in Instructional Computing AwardATAC, University of Iowa
Name & DescriptionCategoryRoleTypeScopeStart YearEnd Year
Colloquium CommitteeAdvisory CommitteeChairUConn-StorrsUniversity20102011
Search CommitteeAdvisory CommitteeMemberUConn-StorrsUniversity20102011
Library/Tech Reports CommitteeAdvisory CommitteeMemberUConn-StorrsUniversity20082011
Biostatistics Program Development CommitteeAdvisory CommitteeMemberUConn-StorrsUniversity20082011
Social CommitteeAdvisory CommitteeMemberUConn-StorrsUniversity20082010
Colloquium CommitteeAdvisory CommitteeChairExternalUniversity20062007
M.S. Exam – Minor CommitteeAdvisory CommitteeChairExternalUniversity20062007
Computer CommitteeAdvisory CommitteeMemberExternalUniversity20062007
Colloquium CommitteeAdvisory CommitteeMemberExternalUniversity20052006
Social CommitteeAdvisory CommitteeMemberExternalUniversity20052006
Search CommitteeAdvisory CommitteeMemberExternalUniversity20042006
Social CommitteeAdvisory CommitteeChairExternalUniversity20042005
Computer CommitteeAdvisory CommitteeMemberExternalUniversity20032004
M.S. Exam - Minor CommitteeAdvisory CommitteeMemberExternalUniversity20032006
Social CommitteeAdvisory CommitteeMemberExternalUniversity20032004
American Statistical AssociationProfessional/Scientific OrganizationMemberExternalNational
International Biometric SocietyProfessional/Scientific OrganizationMemberExternalNational
Econometric SocietyProfessional/Scientific OrganizationMemberExternalNational
American Geophysical UnionProfessional/Scientific OrganizationMemberExternalNational
Annals of StatisticsProfessional/Scientific JournalReviewerExternalNational
Applied Stochastic Models in Business and IndustryProfessional/Scientific JournalReviewerExternalNational
BiometricsProfessional/Scientific JournalReviewerExternalNational
BiometrikaProfessional/Scientific JournalReviewerExternalNational
Computational StatisticsProfessional/Scientific JournalReviewerExternalNational
Computational Statistics and Data AnalysisProfessional/Scientific JournalReviewerExternalNational
Environmental and Ecological StatisticsProfessional/Scientific JournalReviewerExternalNational
IEEE Transactions on Neural NetworksProfessional/Scientific JournalReviewerExternalNational
International Journal of ForecastingProfessional/Scientific JournalReviewerExternalInternational
Journal of American Statistical AssociationProfessional/Scientific JournalReviewerExternalNational
Journal of Royal Statistical Society Series BProfessional/Scientific JournalReviewerExternalInternational
Journal of Royal Statistical Society Series CProfessional/Scientific JournalReviewerExternalInternational
Journal of Statistical SoftwareProfessional/Scientific JournalReviewerExternalNational
Statistica SinicaProfessional/Scientific JournalReviewerExternalNational
Statistics in MedicineProfessional/Scientific JournalReviewerExternalNational
Stochastic Environmental Research and Risk AssessmentProfessional/Scientific JournalReviewerExternalNational
Dynamic Survival Models, Longitudinal Data Analysis, Spatial Statistics, Estimating Functions, Statistical Computing, Biostatistics, Public Health Applications, Econometrics.

Journal Articles

Book Chapters

  • Multivariate modeling with copulas and engineering applications
    Yan J Handbook of Engineering Statistics 2006 Jan;973-990

Reviews

  • Book Review: Gaussian Markov random fields: Theory and applications by: Harvard Rue and Leonhard Held
    Yan J Journal of the American Statistical Association 2006 Jan;101(473):388-389
  • Book Review: Analysis of multivariate survival data by: Phillip Hougaard
    Yan J Journal of the American Statistical Association 2005 Jan;100(469):355-356
  • Book Review: Bayesian survival analysis by: Joseph G. Ibrahim, Ming-Hui Chen, and Debajyoti Sinha
    Yan J Journal of the American Statistical Association 2004 Jan;99(468):1202-1203
  • Book Review: Survival analysis: Techniques for censored and truncated data (2nd ed.) by: John P. Klein and Melvin L. Moeschberger.
    Yan J Journal of the American Statistical Association 2004 Jan;99(467):900-901
Title or AbstractTypeSponsor/EventDate/YearLocation
Augmented estimating equations for semiparametric panel count regression with informative censoringTalkENAR Spring Meeting2011
Nonparametric rank-based tests of bivariate extreme-value dependencePosterUMass-UConn Jonit Statistics Symposium2010
Augmented estimating equations for semiparametric panel count regression with informative censoringTalkYunnan University, International Conference on Statistical Analysis of Complex Data"2010
Nonparametric rank-based tests of bivariate extreme-value dependenceTalkHarvard University, 2010 New England Statistics Symposium2010Cambridge, MA
Combining data for efficient prediction of the spatial distribution of Iowa residential radon levelsTalkJoint Statistical Meetings2009Washington, DC
Fast large sample goodness-of-fit test for copulasTalkDepartement de math ematiques et de statistique2008Sainte-Foy, Quebec, Canada
Tests of serial independence for multivariate time series based on a Mobius decomposition of the independence empirical copula processTalkInternational Statistics Forum 20082008Haidian, Beijing, China
Partly functional temporal process regression with semiparametric profile estimating functionsTalkDivision of Biostatistics, Yale University2008New Haven, CT
Spatial stochastic volatilityTalkFar Eastern Meeting of the Econometrics Society (FEMES)2006Beijing, China
Partly functional temporal process regressionTalkINFORMS International Conference 20062006Hong Kong, China
Spatial stochastic volatilityTalkDepartment of Economics, University of Illinois2006Champaign, IL
Temporal process regressionTalkJoint Statistical Meeting2004Toronto, Canada